One AutoSIR2+ chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), which encourages growth of dendrites for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.

 Key Features

• Measurements from all 256 Channels can be taken in <30 seconds
• Applied Voltage: +1V to 100V
• Measurement Range: 10⁶ Ω to 10¹⁴ Ω
• Measurement Method: Continuous on all selected channels
• Measurement Test Intervals: Fully selectable from minimum of 1 minute
• Capable of testing to all existing test specifications – IPC – IEC – JNC and other user specifications
• Future proofed design
• AutoSIR2+ is available with 64, 128 or 256 channel configurations
• On connection the system runs a self test
• Adaptable and flexible software operating with Windows 7, 8 &10

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AutoCAF2+ is able to measure up to 256 individual measurement sites under conditions of high humidity and temperature in accordance with IPC-TM-650 2.6.25 Test Method & IPC 9691 CAF Test Users Guide.

Conductive anodic filament (CAF) failure is copper corrosion within a printed board. It is electro-migration of the copper from Anode to Cathode between two conductors of different potential, whereas growth from Cathode to Anode is a dendrite.

A combination of bias voltage and high humidity enhance CAF failures. Electrical failure results when a filament grows between electrically isolated nets. See IPC-9691 for further information on CAF.

The NEW AutoCAF2+ was developed in conjunction with a major CAF research project conducted by the British NPL.

Key Features

• Measurements from all 256 Channels can be taken in <30 seconds
• Applied Voltage: +1V to 1250V
• Measurement Range: 10⁶ Ω to 10¹⁴ Ω
• Measurement Method: Continuous on all selected channels
• Measurement Test Intervals: Fully selectable from a minimum of 1 minute
• Capable of testing to all existing test specifications – IPC – IEC – JNC and other user specifications
• Future proofed design
• AutoCAF2+ is available with 64, 128 or 256 channel configurations
• Adaptable and flexible software operating with Windows 7, 8 &10.

The post GEN3 | AUTOCAF2+™ CONDUCTIVE ANODIC FILAMENT TESTING appeared first on ASI Technologies.

The MUST System 3 is the latest technological evolution of the original Multicore Universal Solderability Tester (MUST) that grandfathered all modern solderability test standards. It remains the unquestioned industry benchmark for solderability testing.

The MUST was originally developed by collaboration through a EU “Bright Project” together with NPL, Siemens and Philips. The NPL continue to assist in development of this test method.

Capable of measuring down to 0.001mN the MUST is THE most accurate and comprehensively equipped test system of its type in the world.

Gen3 actively participates in standards development work with IEC, IPC, ISO, BSI and other official standards authorities to help maintain and develop solderability metrology.

The MUST 3 sets the standard – it performs solderability testing in accordance with all major international standards and comprises everything necessary for all forms of solderability tests.

Key Features

• Automatic component alignment and testing
• Immediate pass/fail information on completion of each test
• Step and repeat function for multi-leaded devices
• 4 Individual globule blocks for wetting balance testing
• Testing ability down to 0201 devices
• Superior Gauge R&R
• Greater accuracy  using a sampling rate measuring to levels better than 0.1mN/BIT
• Force Resolution 0.001mN
• Immersion depth 0-30mm at a resolution of 0.01mm
• Immersion speed 0-30mm/s (resolution 0.05mm/s)
• USB Camera
• Smooth, fast and quiet in operation

See data attached

Solderability Testing | MUST3 | Solderability Test System (gen3systems.com)

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For more information and orders, contact us

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